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All the articles related to yield data analysis. There will be articles on the reports generated by analysis tools in yield enhancement like box plots, trends, correlation mats, bin pareto, wafer maps, binmaps etc...

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# Article Title Author Hits
1 Wafermaps And Binmaps Aparna Joshi 2800
2 Product Sensitivity Analysis Jerod Mason, David Petzold, Aparna Joshi, Edward Aspell 7219
 
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