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Articles will discuss the terms involved in yield data analysis. For example, generic definition of Yield, semiconductor yield, reticles, wafers, lots, limits, lot genealogy etc. Articles explaining statistical terms such as Cp, Cpk, tukey test will also be listed in this category.

Recommeded Reading is

- A book Collaboratism by Andre van de Geijn

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# Article Title Author Hits
1 Lot Genealogy Aparna Joshi 4136
2 Basic Terms involved Aparna Joshi 3479
3 Statistical Terms Aparna Joshi 4329
4 Definition of Yield Aparna Joshi 37190
 
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